Ebook Gettering Defects in Semiconductors (Springer Series in Advanced Microelectronics Book 19) (English Edition)

Beschreibung Gettering Defects in Semiconductors (Springer Series in Advanced Microelectronics Book 19) (English Edition)

Gettering Defects in Semiconductors fulfills three basic purposes:– to systematize the experience and research in exploiting various gettering techniques in microelectronics and nanoelectronics;– to identify new directions in research, particularly to enhance the perspective of professionals and young researchers and specialists;– to fill a gap in the contemporary literature on the underlying semiconductor-material theory.The authors address not only well-established gettering techniques but also describe contemporary trends in gettering technologies from an international perspective. The types and properties of structural defects in semiconductors, their generating and their transforming mechanisms during fabrication are described. The primary emphasis is placed on classifying and describing specific gettering techniques, their specificity arising from both their position in a general technological process and the regimes of their application. This book addresses both engineers and material scientists interested in semiconducting materials theory and also undergraduate and graduate students in solid–state microelectronics and nanoelectronics. A comprehensive list of references provides readers with direction for further reading.

Gettering Defects in Semiconductors (Springer Series in Advanced Microelectronics Book 19) (English Edition) ebooks

Gettering Defects in Semiconductors (Springer Series in ~ Gettering Defects in Semiconductors (Springer Series in Advanced Microelectronics Book 19) (English Edition) eBook: Victor A. Perevostchikov, Vladimir D. Skoupov, Victor Gloumov: : Kindle-Shop

Gettering Defects in Semiconductors / SpringerLink ~ Gettering Defects in Semiconductors fulfills three basic purposes: – to systematize the experience and research in exploiting various gettering techniques in microelectronics and nanoelectronics; – to identify new directions in research, particularly to enhance the perspective of professionals and young researchers and specialists;

Gettering Defects in Semiconductors (Springer Series in ~ Gettering Defects in Semiconductors (Springer Series in Advanced Microelectronics) / V.A. Perevostchikov, V.D. Skoupov / download / B–OK. Download books for free .

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Gettering defects in semiconductors (eBook, 2005 ~ Gettering Defects in Semiconductors fulfills three basic purposes: -- to systematize the experience and research in exploiting various gettering techniques in microelectronics and nanoelectronics; -- to identify new directions in research, particularly to enhance the perspective of professionals and young researchers and specialists; -- to fill a gap in the contemporary literature on the .

Book « Gettering Defects in Semiconductors Springer Series ~ Gettering Defects in Semiconductors Springer Series in Advanced Microelectronics By Victor A. Perevostchikov Springer. Paperback. Book Condition: New. Paperback. 388 pages. Dimensions: 9.0in. x 6.0in. x 0.9in.Gettering Defects in Semiconductors fulfills three basic purposes: to systematize the experience and research in exploiting various .

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Gettering Defects in Semiconductors (Springer Series in ~ Gettering Defects in Semiconductors (Springer Series in Advanced Microelectronics Book 19) eBook: Perevostchikov, Victor A., Skoupov, Vladimir D., Gloumov, Victor .

Gettering Defects in Semiconductors (Springer Series in ~ Gettering Defects in Semiconductors (Springer Series in Advanced Microelectronics Book 19) eBook: Victor A. Perevostchikov, Vladimir D. Skoupov, Victor Gloumov: : Kindle Store

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Gettering Defects in Semiconductors (eBook, 2005 ~ Edition/Format: eBook: Document : EnglishView all editions and formats: Publication: Gettering defects in semiconductors. Rating: (not yet rated) 0 with reviews - Be the first. Subjects: Optical materials. Chemical engineering. Chemistry. View all subjects; More like this: Similar Items

Gettering Defects in Semiconductors Buch versandkostenfrei ~ Gettering Defects in Semiconductors fulfills three basic purposes: - to systematize the experience and research in exploiting various gettering techniques in microelectronics and nanoelectronics; - to identify new directions in research, particularly to enhance the perspective of professionals and young researchers and specialists; - to fill a gap in the contemporary literature on the .

Gettering and Defect Engineering in Semiconductor ~ Gettering and Defect Engineering in Semiconductor Technology (GADEST 2019) . Germany. It is the 19 th GADEST conference, which brings together more than 100 researchers from all over the world. The GADEST conference series provides a forum for interaction between scientists and engineers engaged in the field of semiconductor defect physics, materials science and device technology. The .

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Gettering Defects in Semiconductors By author Vladimir ~ [(Gettering Defects in Semiconductors)] [By (author) Vladimir Perevostchikov ] published on (December, 2005) / Vladimir Perevostchikov / ISBN: / Kostenloser Versand für alle Bücher mit Versand und Verkauf duch .

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Gettering / SpringerLink ~ Silicon single crystals for semiconductor device applications are usually produced in the form of slices, with a diameter in the range 5 – 15 cm and thickness in the range 0.02 – 0.06 cm. The slice.

Holdings: Gettering and defect engineering in the ~ Gettering and defect engineering in the semiconductor technology : International Autumn Meeting Gettering and Defect Engineering in the Semiconductor Technology. 0002: proceedings : GADEST. 1987 : Garzau, 11.10.87-17.10.87. gettering and defect engineering in semiconductor technology : Saved in: Personal Name(s): Richter, Harald, (editor) Imprint: Frankfurt : Institut für Halbleiterphysik .

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